Park Systems XE-70 Atomic Force Microscopy is one of the Scanning Probe Microscopic (SPM) techniques which provides 3D morphology of the sample and also measures the surface roughness. Surface morphology of solid samples (polymer, powder, metals, semiconductors etc.) with STM Sample Requirements: Solid samples (Max 1cm x 1cm x 1cm), powder samples coated on a surface (say silicon wafer or mica). Specifications: Modes: Contact and Non-contact Topology Resolution: 3 nm