Application : -X-ray diffraction (XRD) is a versatile non-destructive analytical technique used to analyze physical properties such as phase composition, crystal structure and orientation of powders to solids, thin films and nanomaterials. Many materials are made up of tiny crystallites. The chemical composition and structural type of these crystals is called their 'phase'. Materials can be single-phase or multiphase mixtures and may contain crystalline and non-crystalline components. In an X-ray diffractometer, different crystalline phases give different diffraction patterns. Phase identification can be performed by comparing X-ray diffraction patterns obtained from unknown samples to patterns in reference databasess SPECIFICATIONS: XRD Model: Rigaku Ultima IV Source: Cu Kα Voltage/Current: 40 kV / 30 mA Operation Mode: 2θ–Ω / 2θ Contact: MAIF, CoE-AMGT for scan details