Field Emission Scanning Electron Microscopy (FESEM) FESEM provides topographical and elemental analysis of samples at 30× to 200,000× magnification. The ZEISS Gemini 300 features a Schottky field emission gun, multiple detectors, and Oxford Instruments EDS with color mapping. An oil-free vacuum ensures hydrocarbon-free imaging. Applications: Study of inclusions, slags, oxides, second-phase analysis in metals and alloys, nanomaterials, and biomaterials. FESEM Specifications – ZEISS Gemini 300 Detectors: Secondary Electron Detector (In-lens and Everhart-Thornley) Backscattered Electron Detector (In-lens and Multi-quadrant Solid State) Magnification: 30× – 2,000,000× Acceleration Voltage: 0.02 – 30 kV Resolution: 0.8 nm at 15 kV 1.4 nm at 1 kV